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Surface Roughness Testing Equipment

Surface Roughness Testing Equipment
Surface Roughness Testing Equipment
Product Code : 12
Product Specification

By keeping track with the market development, we are engaged in manufacturing and supplying an optimum quality Surface Roughness Testing Equipment. Well known for its compact design and high accuracy, this equipment is generally used to measure the surface texture of metal and non-metal parts. This testing equipment is manufactured in compliance with industry set standards with the help of well tested components that we procured from the genuine vendors of the market and the latest technology. Also, this Surface Roughness Testing Equipment is stringently checked against numerous parameters by our quality controllers.


Linear motor drive achieves low vibration texture measurements

  • First  roughness Mesurement instrument with Linear motor: The new linear motor enables the world's fastest measurement speeds and low vibration for stable, high-magnification measurement. A linear, non-contact drive unit and simple ensures vibration-free and stable, long-term operation.

  • High speed measuring for dramatically improved productivity:Very high speed of 3mm/s maximum for roughness measuring, 20mm/s maximum for wave measuring, 60mm/s maximum for movement speed. it is 5 to 10 times better than other ACCRETECH machines.

  • High-performance compact pickup:
    Measuring range is 1000µm with and outside diameter of 14 mm, and magnification of 500K 

  • Smaller footprint:
    A new modern design reduces the system footprint by 25%.

  • A leader in Expandablity:
    You can upgrade from 2D to 3D roughness measurement of support both roughness )

  • Patented Artificial Intelligence Function simplifies Measuring:the measuring instrument selects suitable roughness setting and analyzing condition that are not pre-configured.

  • Full Automation improves Measuring Efficiency:
    A moving speed of 6mm/s dramatically improves measuring when full automatic.

  • TIMS Flexible Measuring system:

  • World wide Machine:Freedom to Re-analyze after a single Measurement:

  • Dramaticaly Enhanced profile Evalution functions:

Flexible input and output functions


Measuring range/ resolution:

Z-axis (vertical): 1000µm/ 0.02µm to 6.4µm/0.0001µm     X-axis(horizontal): 100mm/0.04 µm or 32,000 points (300,000 data uptake points)


0.05+ 1.0L/1,000µm L-Measuring length.

Analysis items:Standards : Complies with JIS-2001, JIS-1994, JIS-1982, ISO- 1997, ISO-1984, DIN-1990, ASME-1995, CNOMO.       


Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz,J, R3z, Sm, S, R Δa, R Δq, R λa, R λq, TILT A, Ir, Pc, Rsk, Rkpk, Rvk, Mr1, Mr2, VO, K, tp, Rmr, Tp2, Rmr2, R δc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR

Evaluation curves: Section profile curve, filtered waviness curve, foltered center line waviness curve, rolling circle waviness curve, rolling circle center line waveness curve, DIN4776 special curve, roughness motif curve, envelope waviness curve

Surface Characteristics graphs: Bearing area, curve, amplitude distribution (ADF) curve, power graph

TILT Correction: Linear correction, first half correction, latter half correction, both end correction, spline curve correction

Vertical (Z-axis): 50-500K, arbitrary, auto
Horizantal(X-axis): 0.1- 20K arbitrary, auto


Tip radius: 2µm, Material: Diamond

Special functions: Artificial intelligence functions, Waveform superimposition, Automatic Operation. Specifications:

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  • Contact Details
  • 806, T.C. Jaina Tower-I, District Centre, Janakpuri, New Delhi - 110058, India
  • Mr. Bob Albin (Director)